Mantis 5000 Especificaciones descargar pdf (Pagina 59)

4. Click the Start button.

5. If the standard reference option was used for the baseline scan, the reflectance spectra

is generated automatically. If the simple or zero baseline correction was selected,

multiply the sample scan data by the spectral reflectance factors for the calibrated

reflectance standard.

8°/d Reflectance Factor Measurements (Comparison Method)

The DRA integrating sphere is fitted with a specular exclusion port. When the exclusion

port plug is removed, the specular component of reflection from the sample is directed

out of the sphere and is not sampled by the detector. The diffuse component of the main

beam reflection remains inside the sphere and is sensed by the sphere detector. The

procedure for diffuse reflectance factor measurement is as follows:

1. Collect a Baseline scan

2. Replace the reflectance standard at the sample reflectance port with the sample.

3. Replace the specular port plug with the specular port light trap. Do not change the

configuration of the integrating sphere in any other way.

4. Click the Setup button and check the parameters. Normally, the setup parameters for

the application should match those used for the baseline scan. If using a previously

defined baseline correction, retrieve the correct baseline

5. Click the Start button.

6. If the standard reference option was used for the baseline scan, the reflectance spectra

is generated automatically. If the simple or zero baseline correction was selected,

multiply the sample scan data by the spectral reflectance factors for the calibrated

reflectance standard.

8°/h Reflectance Factor Measurements (Single Beam Mode)

Although the DRA is a double beam accessory, single beam operation is still possible.

When operating the DRA in this mode, a substitution error will be present in the

reflectance measurement data. The reference beam entrance port can be blocked off using

a Spectralon surface during the baseline and sample scans. The following procedure can

be used to measure the hemispherical reflectance of a sample.

1. Collect a Baseline scan

, making sure the instrument is configured for single rear beam

mode.

2. Replace the reflectance standard at the sample reflectance port with the sample. Do

not change the configuration of the integrating sphere in any other way.

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Mantis 5000 Especificaciones Pagina 59