
7. Select the Baseline button from the Scan dialog. Follow the on-screen prompts to
perform a 100%T baseline scan and a 0%T baseline scan.
Hot Tip
When performing reflectance measurements, remove the PTFE reference disk from
the sample port and allow the light to be trapped by the magnetic port covers.
8. Once the baseline correction is complete, the Ordinate status display in the top left
corner of the dialog will show ’Zero baseline’ in red text.
9. Clamp the sample over the sample port. The sample should be homogeneous,
substantially flat, and large enough to completely cover the image.
10. Press the Start button. The Save As dialog will appear, allowing the method to be
saved as either a data file or a batch file. If the file is saved as a batch file, all of the
method parameters will be stored with the scan.
Specular-only reflectance measurements
Note
Parameters activated by a radio button that are not specifically mentioned in the
following procedure should be set to ’Off’ (e.g., the Signal-to-noise mode radio
button). These parameters will not affect the procedure.
1. From the Setup menu, set the following parameters:
Cary tab
X mode: Mode Nanometers
X mode: Start 800
X mode: Stop 300
Y mode: Mode % R
Y mode: Y min 0.00
Y mode: Y max 100.00
Scan controls:
Ave time (s)
0.100
Scan controls: Data
interval (nm)
1.000
Scan controls: Scan
rate (nm/min)
600.00
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